Chip tester

Chip Tester

Table of contents:

Description

The device is designed to test logic integrated circuits: TTL and CMOS (74, 40, and 45 series), SRAM, DRAM and EEPROM, can also test some operational amplifiers, optocouplers sensors, and more. Menus and results are displayed on a 128x128 color display.

The device is powered by the miniUSB port, through which it can also be connected to a computer. The software allows you to develop and debug tests, read the contents of ROM, start testing chips with the display of results and update the firmware.

Supported chips

At the moment, the test base has about 250 chips and this figure is constantly growing.

Below is a list of supported logic chips

TTL, 74-series

00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 10, 11, 12, 13, 14, 15, 16, 20, 21, 22, 23, 25, 26, 27,
28, 30, 32, 33, 34, 37, 38, 40, 42, 50, 51, 53, 54, 55, 64, 72, 74, 75, 77, 82, 83, 85, 86, 90,
92, 93, 95, 107, 109, 112, 113, 114, 125, 126, 128, 132, 134, 136, 138, 139, 140, 145, 148, 150,
151, 152, 153, 154, 155, 156, 157, 158, 160, 161, 162, 163, 164, 165, 166, 168, 169, 170, 173,
174, 175, 180, 181, 183, 184, 190, 191, 192, 193, 195, 198, 238, 240, 241, 242, 243, 244, 245, 251,
253, 257, 258, 259, 260, 273, 279, 280, 295, 298, 299, 323, 352, 353, 365, 366, 367, 368, 373,
374, 375, 377, 393, 396, 452, 465, 466, 533, 541, 573, 574, 595, 597, 620, 640, 643, 646, 651,
652, 670, 688, 873, 874, 1000, 1002, 1003, 1004, 1005, 1008, 1010, 1011, 1020, 1032, 1034, 1035,
4035, 4520

CMOS, 40- and 45-series

4001, 4002, 4003, 4008, 4011, 4012, 4013, 4015, 4016, 4017, 4018, 4019, 4020, 4022, 4023, 4025, 4027,
4028, 4028, 4029, 4035, 4036, 4040, 4043, 4049, 4050, 4052, 4053, 4060, 4061, 4066, 4069, 4070, 4071,
4073, 4081, 4093, 4094, 4502, 4503, 4511, 4516, 4519, 4520, 4555, 4556, 40103, 40106, 40161

Intel 82- and 32-series

8255, 8282, 8283, 8286, 8287,
8212/3212
8216/3216, 3226

Other logic

Am25S05 AM2507, AM2508, AM25S10
Am29705
MSD047, MSD101
DS3881
MC14194
MC14580, MC14585, MC14554

USSR TTL, 155/531/555/1531/1533 series

AP2, AP3, AP4, AP5, AP6, AP9, AP10, AP14, AP15, AP16, AP17, AP24, AP26
ID3, ID4, ID5, ID6, ID7, ID9, ID10, ID11, ID12, ID13, ID14, ID15
IЕ1, IЕ2, IЕ4, IЕ5, IЕ6, IЕ7, IЕ8, IЕ9, IЕ10, IЕ11, IЕ12, IЕ13, IЕ14, IЕ15, IЕ16, IЕ17, IЕ18, IЕ19, IЕ23
IM2, IM3, IM5
IК1
IP2, IP3, IP4, IP5, IP6, IP7
IR1, IR8, IR9, IR10, IR11, IR12, IR13, IR15, IR16, IR17, IR18, IR19, IR21, IR22, IR23, IR24, IR26, IR27, IR29, IR30, IR32, IR33, IR34, IR35, IR37, IR38, IR40, IR43, IR51, IR52
IV1
КP1, КP2, КP5, КP7, КP11, КP12, КP13, КP14, КP15, КP16, КP17, КP18, КP19
LA1, LA2, LA3, LA4, LA6, LA7, LA8, LA9, LA10, LA11, LA12, LA13, LA16, LA17, LA18, LA19, LA21, LA22, LA23, LA24
LЕ1, LЕ2, LЕ3, LЕ4, LЕ5, LЕ6, LЕ7, LЕ10, LЕ11
LI1, LI2, LI3, LI4, LI5, LI6, LI8, LI9, LI10
LL1, LL2, LL4
LN1, LN2, LN3, LN5, LN6, LN7, LN8, LN10
LP3, LP5, LP7, LP8, LP9, LP10, LP11, LP12, LP16, LP17
LR1, LR3, LR4, LR9, LR11, LR13
TM2, TM5, TM7, TM8, TM9, TM10
TR2
TV1, TV6, TV9, TV10, TV11, TV15
TL1, TL2, TL3 RP1
PR6, PR7
RU2, RU5
SP1

USSR CMOS, 176/561/1561 series

ID1, ID2, ID3, ID6, ID7,
IЕ1, IЕ3, IЕ4, IЕ8, IЕ9, IЕ10, IЕ11, IЕ14, IЕ16, IЕ19, IЕ20, IЕ21
IК1
IM1
IP2, IP5
IR2, IR3, IR6, IR9, IR10, IR11, IR12, IR15
КP1, КP2, КP4,
КT1, КT3
LA7, LA8, LA9, LA10
LЕ5, LЕ6, LЕ10
LI1, LI2
LN1, LN2, LN3
LP2, LP4, LP11, LP12, LP13, LP14
LS2
PR1
PU4, PU7
RU2
TV1
TL1
TM1, TM2, TM3
TR2

USSR other chips

КR1561КP1, КR580VV55
КR580IR82, КR580IR83
КR580VA86, КR580VA87
K589IR12
K589AP16, K589AP26
KР1802IR1 KR514ID1, KR514ID2
K559IP1
KR571XL4, K1102AP13

SRAM

2102A (1024 x 1)
MM2114,UM6114 (1024 x 4)
D2115A (1024 x 1)
61C16, 62C16 (2K x 8)
61C64, 62C64, DS2064 (8K x 8)
61C256, 62C256 (32K x 8)
61C512, 62C512 (64K x 8)
62C1024, HM628128, TC551001, 6C4008 (128K x 8)
K565RU2 (1024 x 1)
K132RU4 (1024 x 1)
K537RU10 (2K x 8)

DRAM

2118 (16K x 1)
4164 (64K x 1)
41256 (256K x 1)
KM41C1000 (1M x 1)
4416 (16K x 4)
41464, 4464 (64K x 4)
514256 (256K x 4)
K565RU5 (64K x 1)
K565RU6 (16K x 1)
K565RU7 (256K x 1)

ROM (reading and checking for "cleanliness")

SN74188N (K155RE3)
SN74287 (556RT4), Intel 3601, 3621 (556RT5)
27C16, 27C32, 27C64, 27C128, 27C256, 27C512

Operational amplifiers

LM358 (LM158, LM258, LM2904)
LM393 (LM193, LM293, LM2903)
LM386
LM324 (LM124, LM224, LM2902, TL084)

Also, the tester should work with other op-amps that have the same pinout and work from a 5V unipolar voltage source.

Optocouplers

PC817, PC827, PC837, PC847,
HCP2601 (6N137, HCP2611),
4N35,
TLP504A, TLP504A-2
CN74-2, CN74-4

Other analog IC

ULN2003 (ULN2002, ULN2004)
ULN2803

Sensors

DS18B20, DS18S20, DS1822 (temperature sensors)
DHT11 (humidity and temperature sensor)

Device

The device consists of two boards. The main board contains the ZIF-socket, LCD, keyboard, microcontrollers and USB-to-UART. Additional board contains MOSFETs and control registers.

Assembled device:

Chip tester board, top Chip tester boards, bottom
Chip tester in case

User interface

Main menu

When you turn on the tester, we see the main menu:

Chip tester main menu

From the menu you can run an automatic test of logical- and analog-microcircuits, perform a manual test, check the SRAM, DRAM, or EPROM. You can also open Settings and see information about the firmware version and the number of tested chips in the database.

Testing chips with autodetect

To check and identify microcircuits, use the first menu item (Detect & Test). First you should choose the type of chip - CMOS (40- and 45-series), TTL (74-, 82- and 32-series ant othe logic chips), Analog(operational amplifiers, optocouplers, ULNxxxx) or Sensors(DS18xxx, DHT11)

Chip type selecting

After that, you can install the chip to the ZIF-socket:

Before test

On this screen, you can press the up button to turn on Power ON, and use the down button to turn it OFF. When it is OFF (this is the recommended mode) power to the chip under test will be supplied from the microcontroller. When Power ON, the tested chip will be powered through MOSFETs, which provide more current. It makes sense to use this mode if the test with Power OFF fails.

Pressing the right or center buttons starts the test:

Testing progress

The device will iterate over all the tests in its database and show a list of chips for which the tests were successful. For example, for the 74LS465 chip, the result would be (here "АП14" its analogue from the USSR):

Logical chip test result

If no tests are successful, the device will restart them, but in a slower mode. Additional delays will be added between signaling the input and reading the outputs. If after this the test is successful, a number is displayed at the bottom of the screen. This number characterizes the speed of the chip (the smaller - the faster):

Logical chip test result for slow chips

If this test also fails, the result will be "Unknown".

Unknown or damaged chip result

To re-check, you can click the right button.

Analog chips test

When checking analog circuits, their pinout is displayed. If the microcircuit contains several gates (operational amplifiers, optocouplers) and some of them are faulty, then they are displayed in red and crossed out:

Check result: LM324 Check result: LM358 Check result: LM386 Check result: PC817 Check result: PC827 Check result: PC847 Check result: ULN2003

Op amps tested in comparator mode.

SRAM and DRAM testing

Before starting the memory test, a prompt appears to insert the chip into the panel and turn on / off the power. As a result of the check, the device itself will determine the type of chip installed.

The result of the check is displayed in the form of a map. The filled cells are completely serviceable areas, crosses - the area contains bad cells. "Good" memory areas are shown by filled cells, Bad aread are shown to crosses. Test Result for DRAM 4164 (565РУ5 - analogue from the USSR):

4164 DRAM test - no errors

And this is how the result looks if there are a lot of bad cells::

4164 DRAM test with errors

Another example - 41256 (565РУ7 - analogue from the USSR) with several bad cells:

41256 DRAM test with errors

For static memory, the result screen looks like this in the case of a working chip:

61c256 test, no erros

In case of errors, the memory map and data bus bits on which errors are found are displayed on the screen:

61c256 test, with erros

In this example, the chip has problems working with data bits 7 and 4.

EEPROM blank checking

Tester can read some EEPROM chips and check if they are "blank". If the chip contains data, then the percentage of pure bits and bytes is displayed.

First, select the type of chip:

Select EEPROM Select EEPROM

After checking, either a message is displayed that the chip is completely blank, or information about the number of recorded bits and bytes.

Blank EEPROM result EEPROM with data result

Custom test

Custom test mode allows you to set the desired levels at the inputs of the chip and see the status of its outputs. First choose a case:

Custom test, package choose

Manual test has two modes - "Setup" and "Output". Use the cursor buttons to move between the pins and mode names. In Setup mode, you configure the pins for input or output and configure the power of the chip. This mode has three sub-modes - "I/O", "GND" and "VCC". The outputs are drawn with the arrow FROM the chip. If the arrow is directed TO the chip, then the pin is's input, and the tester can change the level on it. In "I/O" submode, you can configure each pin as input or output.

In GND submode, you can connect minus power (ground) to the chip. ZIF pins, that connected which the GND MOSFETs, are marked with a blue circles. VCC submode is similar to GND, and supplies + 5V power to the pins. ZIF pins, that connected which the VCC MOSFETs, are marked with a red circles.

Manual test, DIP-8, SETUP mode Manual test, DIP-8, pin selection Manual test, DIP-8, VCC power Manual test, DIP-20, GND power Manual test, DIP-20, set inputs

In Output mode, the tester can change the status of the inputs and outputs of the chip. The output voltage levels are displayed outside the chip package. The green square means high logic level. For input pins it means pull-up.

The status of the outputs of the chip is displayed by blue squares inside its package.

To exit to the main menu, select the "Exit" button in the lower right corner and press the center button.

Settings screen

Settings

Here you can configure the automatic shutdown of the backlight by timeout. If Backlight is on, the backlight will always be on.

You can also adjust the volume of sound beeps when you press the keys and in the case of completion of tests.

Also here you can select the default value of Power before the tests.

The Configure menu item will perform a self-test and display the connection diagram of mosfets to socket pins

Power settins Power settins Power settins Power settins

Here on the left are the numbers of MOSFETs, and on the right are the pins of the panel with which these keys are connected. In total, the device has 24 mosfets - 16 connect the ground and 8 connect the VCC.

If the MOSFETs module is missing, not connected or not recognized for any reason, the tester will report this:

MOSFETS not found

The Chips parameter determines which chip names will be displayed: USSR - show only chip names according to the USSR classification
USA - show only chip names according to USA classification (Tehas Instruments, Intel)
All - show all names

About screen

Here you can see information about the firmware version, its authors and the number of TTL and CMOS tests in the database.

About screen About screen

Software

The tester is connected to the computer via a miniUSB cable.

Software allows

  1. create, compile and debug tests
  2. read ROM contents
  3. запускать тестирование микросхем
  4. update tester firmware

The program is written in Java and requires a Java Runtime version of at least 8. To run software use command

java -jar software.jar

First you need to initialize the device. In the main menu select -> "Device" -> "Connect to". This will display a list of detected COM ports. Among them, select the port to which the tester is connected. If successful, the connection will be established, and the port name will be remembered, a command to connect to this (last successful) port will appear in the Device menu. When connected, the program will check for firmware updates on the server and offer to update if it finds a new version.

Menu command Device -> "Device info" displays the device information window. Here you can see the firmware version, make a backup copy of the firmware and update it (buttons "Read firmwre" and "Write firmware", respectively).

Tester firmware info

On the menu -> Windows can open one of the three tester windows. "Test builder" is a test editor and debugger. Here you can write, compile, and run tests, performing them step by step.

Chip test editor
Chip test debuger

There is also a manual test mode.

Manual test mode

Menu Command -> Windows -> "Programmer" opens the programmer window (so far you can only read the contents of the ROM chips).

Programmer mode

Menu Command -> Windows -> "Logic tester" opens the logic chip test window. Here you can run the autotest of logic/analog chips, similar to how it is done in the tester.

Test development

The test writing language is described in detail here (in Russian).

The source codes of some tests can be found here

You can purchase the device in the store.

Software:

Downloadsoftware.jar
Rating: 
0
No votes yet